Misplaced Pages

The following pages link to Transistor aging

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• transclusion count
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Showing 11 items.

• Negative-bias temperature instability (links | edit)
• Hot-carrier injection (links | edit)
• Time-dependent gate oxide breakdown (links | edit)
• Reliability (semiconductor) (links | edit)
• High-temperature operating life (links | edit)
• Charge trapping (redirect page) (links | edit)
  • Stress-induced leakage current (links | edit)
  • Photoconductive polymer (links | edit)
• Silicon aging (redirect page) (links | edit)
• Raptor Lake (links | edit)
• Talk:Transistor aging (transclusion) (links | edit)
• User:Gracefool/Created (links | edit)
• User:Tule-hog/All Computing articles (links | edit)