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Max Knoll

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German electrical engineer (1897–1969)
Max Knoll
BornMax Knoll
(1897-07-17)17 July 1897
Wiesbaden, Hesse, Germany
Died6 November 1969(1969-11-06) (aged 72)
Known forElectron Microscopy
Scientific career
FieldsPhysics
InstitutionsTechnische Universität Berlin, Telefunken, University of Munich, Princeton University, Technische Hochschule München

Max Knoll (17 July 1897 – 6 November 1969) was a German electrical engineer and co-inventor of the electron microscope. Knoll was born in Wiesbaden and studied at the University of Munich and at the Technischen Hochschulen in Munich and Berlin-Charlottenburg, where he obtained his doctorate in the Institute for High Voltage Technology. In 1927 he became the leader of the electron research group there, where he and his co-worker, Ernst Ruska, invented the electron microscope in 1931. In April 1932, Knoll joined Telefunken in Berlin to do developmental work in the field of television design. He was also a private lecturer in Berlin.

After World War II, Knoll joined the University of Munich as an extraordinary professor and director of the Institute for Electromedicine. He moved to the USA in 1948, to work at the Department of Electrical Engineering at Princeton University.

In 1956 he returned to Munich and engaged in a series of experiments at the Technische Hochschule, involving the generation of phosphenes by electrically stimulating the brains of himself and other subjects. He retired in 1966.

See also

References

  1. "Max Knoll | Science Museum Group Collection". collection.sciencemuseumgroup.org.uk. Retrieved 2024-05-24.
  2. Freundlich, Martin M. (1963). "Origin of the Electron Microscope". Science. 142 (3589): 185–188. doi:10.1126/science.142.3589.185. ISSN 0036-8075. JSTOR 1712183.
  3. "Ernst Ruska - Autobiography". 2006-07-16. Archived from the original on 2006-07-16. Retrieved 2024-05-24.
  4. Knoll, M.; Kugler, J.; Höfer, O.; Lawder, S.D. (2007-06-20). "Effects of Chemical Stimulation of Electrically-Induced Phosphenes on their Bandwidth, Shape, Number and Intensity". Confinia Neurologica. 23 (3): 201–226. doi:10.1159/000104299. ISSN 0010-5678.
Electron microscopy
Basics
Electron interaction
with matter
Instrumentation
Microscopes
EM
SEM
TEM
Techniques
Others
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